Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2005-03-08
2005-03-08
Cygan, Michael (Department: 2855)
Measuring and testing
Surface and cutting edge testing
Roughness
C250S307000
Reexamination Certificate
active
06862924
ABSTRACT:
An improved method is provided for performing nanomanipulations using an atomic force microscope. The method includes: performing a nanomanipulation operation on a sample surface using an atomic force microscope; determining force data for forces that are being applied to the tip of the cantilever during the nanomanipulation operation, where the force data is derived along at least two perpendicularly arranged axis; and updating a model which represents the topography of the sample surface using the force data.
REFERENCES:
patent: 5321977 (1994-06-01), Clabes et al.
patent: 5959200 (1999-09-01), Chui et al.
patent: 6100523 (2000-08-01), Gupta et al.
patent: 6578410 (2003-06-01), Israelachvili
patent: 6666075 (2003-12-01), Mancevski et al.
Hansen et al. “A technique for positioning nanoparticles using an atomic force microscope”, Nanotechnology, vol. 9, No. 4, Dec. 1998, pp. 337-342.*
Kageshima et al. “Lateral forces during manipulation of a single C60 molecule on the Si(001)-2×1 surface”, Surf. Sci. vol. 517, 2002, pp. L557-L562.*
Sagvolden et al. “Manipulation force microscopy”, Rev. Sci. Instrum. vol. 70, No. 6, Jun. 1999, pp. 2769-2775.*
Ludwig et al. “AFM, a tool for single-molecule experiments”, Appl. Phys. A, vol. 68, 1999, pp. 173-176.*
Sitti et al. “Tele-Nanoroboticw Using Atomic Force Microscope”, Proc. 1998 IEEE/RSJ Intl. Conf. Intelligenet Robots and Systems, Oct. 1998, pp. 1739-1746.*
Sitti, M and Hashimoto, H. “Tele-nanorobotics using an atomic force microscope as a nanorobot and sensor” Advanced Robotics vol. 13, No. 4 pp417-436.
Fung Wai Keung
Li Guangyong
Xi Ning
Yu Mengmeng
Board of Trustees operating Michigan State University
Cygan Michael
Harness & Dickey & Pierce P.L.C.
LandOfFree
Augmenting reality system for real-time nanomanipulation... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Augmenting reality system for real-time nanomanipulation..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Augmenting reality system for real-time nanomanipulation... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3451082