Automatic atomic force microscope with piezotube scanner

Details Automatic atomic force microscope with piezotube scanner Automatic atomic force microscope with piezotube scanner

1996-11-13

1998-11-10

Noland, Thomas P.

Measuring and testing

Surface and cutting edge testing

Roughness

310365, G01B 1130

Patent

active

058346449

ABSTRACT:
An atomic force microscope which can provide an automatic operation of focusing a laser beam onto a cantilever of the atomic force microscope, and which can ensure that a laser beam reflected off this cantilever is properly directed to a detector. A tip supported by the cantilever can also be automatically and properly lowered to a specimen. A piezotube scanner within such an atomic force microscope is also provided to prevent any damage from occurring if any leakage of an aqueous solution containing the specimen occurs.

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Patent Abstract of Japan (07-12545) Jan. 17, 1995 "Interatomic-Force-Microscope Detection Apparatus by Differential Heterodgne Interterometer Using Optical-Fiber Array".

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