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Framework for automated testing of enterprise computer systems

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Framework for automatically analyzing I/O performance...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Freeing a serial bus hang condition by utilizing distributed...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Freezing mechanism for debugging

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Frequency detection circuit and data processing apparatus

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Frequency division multiplex transmission signal receiving...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Full scan solution for latched-based design

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Full scan solution for latched-based design

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Full slip defect management system using track identification

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Full volume slip defect management in a disc drive

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Full-speed BIST controller for testing embedded synchronous...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Fully X-tolerant, very high scan compression scan test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fully-buffered dual in-line memory module with fault correction

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Fully-buffered dual in-line memory module with fault correction

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Fully-buffered dual in-line memory module with fault correction

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Fully-buffered memory-module with error-correction code...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Function test support system and function test support...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Functional block for integrated circuit, semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Functional device, function maintaining method and function...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Functional element test tool and method

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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