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Semiconductor integrated circuit, system board and debugging...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Semiconductor memory

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory and method of storing configuration data

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory and method of testing the same

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device and control method thereof

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device and method for executing shift...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device and sales processor having the same

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device capable of accessing all memory...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device having a multibit test mode

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Patent

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Semiconductor memory device having a test circuit

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device having advanced test mode

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device having advanced test mode

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device having advanced test mode

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory device with clocked column redundancy and t

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Patent

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Semiconductor memory device with standby current failure...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory having re-configurable fuse set for...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Semiconductor memory having redundancy circuit

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Patent

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Semiconductor memory including error correction function

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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