Semiconductor memory having re-configurable fuse set for...

Details Semiconductor memory having re-configurable fuse set for... Semiconductor memory having re-configurable fuse set for...

2006-09-19

2006-09-19

Beausoliel, Robert (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S710000, C365S200000

Reexamination Certificate

active

07111193

ABSTRACT:
This invention provides a circuit and a method for re-configuring fuse sets for memory cell array redundancy repair. In addition this invention relates to the use of fuse sets and spare row and column lines in the memory array to repair memory cell defects. Each fuse set can be used for either a row or a column, as needed, during a repair of the memory array. This allows the fuse sets to be allocated freely according to the process defects distribution on the chip and wafer. This results in higher repair efficiency and increased wafer yield.

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