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Calibration target for calibrating semiconductor wafer test...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Calibration target for calibrating semiconductor wafer test...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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Calibration techniques for simplified high-frequency...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
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Calibration unit for semiconductor integrated circuit tester

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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Calorimetric RF power meter with dynamic zeroing and constant te

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With waveguide or long line
Patent

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Camera system for automated verification and repair station

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Can coating tester

Electricity: measuring and testing – For insulation fault of noncircuit elements
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Cancellation of ringing in magnetic resonance utilizing a...

Electricity: measuring and testing – Particle precession resonance – Spectrometer components
Statutory Invention Registration

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Cantilever control device

Electricity: measuring and testing – Of geophysical surface or subsurface in situ – For small object detection or location
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Cantilever magnetic force sensor for magnetic force microscopy h

Electricity: measuring and testing – Magnetic – Magnetic information storage element testing
Patent

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Cantilever magnetic force sensor for magnetic force...

Electricity: measuring and testing – Magnetic – Magnetometers
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Cantilever microprobes for contacting electronic components...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Cantilever microprobes for contacting electronic components...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Cantilever probe structure for a probe card assembly

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Cantilever probe with dual plane fixture and probe apparatus...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Cantilever type probe card and method for production thereof

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Cantilever type probe head having introducing portion with...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Cantilever type probe needle for probe card and method of fabric

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Cantilever-free magnetic resonance force microscope

Electricity: measuring and testing – Particle precession resonance
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Cantilevered manipulator for autonomous non-contact scanning...

Electricity: measuring and testing – Of geophysical surface or subsurface in situ – For small object detection or location
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