Electricity: measuring and testing – Of geophysical surface or subsurface in situ – For small object detection or location
Reexamination Certificate
2006-01-20
2009-08-04
Barnes-Bullock, Crystal J (Department: 2121)
Electricity: measuring and testing
Of geophysical surface or subsurface in situ
For small object detection or location
C324S762010, C073S862634, C073S862639, C073S504150
Reexamination Certificate
active
07570061
ABSTRACT:
A cantilever control device is provided that can prevent, in an atomic force microscope, self-excited oscillation of a cantilever from stopping and prevent a probe of the cantilever from coming into contact with a measurement object. In the atomic force microscope, a cantilever control device1is constituted from a cantilever10having a probe12,an actuator20that causes self-excited oscillation in the cantilever10,an oscillation velocity detector30that detects the oscillation velocity of the cantilever10,a displacement calculator32that calculates the oscillation displacement of the cantilever10,and a controller40that generates a signal for driving the actuator20.A feedback control signal S is represented as (K−G·x2)·dx/dt, where x is the oscillation displacement of the cantilever10,dx/dt is the oscillation velocity of the cantilever10,and both K and G are feedback gains of a positive value.
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Notification (PCT/IB/338) from the International Bureau dated Jul. 31, 2007 and the English translation of the International Preliminary Report on Patentability with Written Opinion, from the corresponding International Patent Application No. PCT/JP2006/300872.
Kuroda Masaharu
Yabuno Hiroshi
Barnes-Bullock Crystal J
National Institute of Advanced Industrial Science and Technology
University of Tsukuba
Young & Basile
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