Cantilever probe structure for a probe card assembly

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S755010, C324S756030

Reexamination Certificate

active

08004299

ABSTRACT:
A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted for contact with the beam such that the beam is cantilevered by the fulcrum.

REFERENCES:
patent: 4599559 (1986-07-01), Evans
patent: 5670889 (1997-09-01), Okubo et al.
patent: 6037785 (2000-03-01), Higgins
patent: 6329827 (2001-12-01), Beaman et al.
patent: 6482013 (2002-11-01), Eldridge et al.
patent: 6835589 (2004-12-01), Pogge et al.
patent: 2001/0012739 (2001-08-01), Grube et al.
patent: 2002/0019152 (2002-02-01), Eldridge et al.
patent: 2002/0151194 (2002-10-01), Grube et al.
patent: 2003/0155940 (2003-08-01), Lee et al.
patent: 2004/0142583 (2004-07-01), Mathieu et al.
patent: 2005/0110507 (2005-05-01), Koizumi et al.
patent: WO 03/067650 (2003-08-01), None
patent: WO 03/071289 (2003-08-01), None
patent: WO 2005/065438 (2005-07-01), None
International Searching Authority, “International Search Report with Written Opinion”, Application No. PCT/US2006/038633, dated Mar. 13, 2007, 14 pages.
Current Claims, PCT/US2006/038633, 4 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Cantilever probe structure for a probe card assembly does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Cantilever probe structure for a probe card assembly, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Cantilever probe structure for a probe card assembly will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2778356

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.