Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-08-23
2011-08-23
Velez, Roberto (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755010, C324S756030
Reexamination Certificate
active
08004299
ABSTRACT:
A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted for contact with the beam such that the beam is cantilevered by the fulcrum.
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Beatson David T.
Laurent Edward
Malantonio Edward L.
Tunaboylu Bahadir
Williams Scott R.
Hickman Palermo & Truong & Becker LLP
SV Probe Pte. Ltd.
Velez Roberto
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