Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-07-12
2011-07-12
Tang, Minh N (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755010, C324S755110
Reexamination Certificate
active
07977960
ABSTRACT:
A cantilever type probe head, the head at least includes a probe having an introducing portion for contacting a pad of a member to be probed, the introducing portion is a conical column with its end face having a tapered portion and an extended rectangular portion, the tapered portion and the extended rectangular portion are provided in a coplanar position at the end face on the introducing portion.
REFERENCES:
patent: 6633176 (2003-10-01), Takemoto et al.
patent: 6842023 (2005-01-01), Yoshida et al.
patent: 7148709 (2006-12-01), Kister
patent: 2006/0171425 (2006-08-01), Lee et al.
ALLSTRON Inc.
Muncy Geissler Olds & Lowe, PLLC
Tang Minh N
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