Cantilever probe with dual plane fixture and probe apparatus...

Details Cantilever probe with dual plane fixture and probe apparatus... Cantilever probe with dual plane fixture and probe apparatus...

2006-08-15

2006-08-15

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

07091729

ABSTRACT:
A cantilever probe has an elbow for bonding to a dual plane fixture plate for a highly stiff and precise angled fixture of the bonded cantilever probe with minimal real estate consumption. The cantilever probe may feature a tip positioning pin and an elbow positioning pin fitting into corresponding holes of the fixture plate and a sacrificial assembly plate. Separate fan-out beams may be attached to the fixture plate and conductively connected to respective elbows once the cantilever probes are fixed. The fan-out beams in turn may be conductively connected with their respective peripheral ends to large pitch apparatus terminals of a circuit board. A probe apparatus may be easily customized by providing varying drill patterns of the positioning holes for fan-out beams and cantilever probes to match pitch requirements of the tested circuit chips.

REFERENCES:
patent: 3599093 (1971-08-01), Oates et al.
patent: 3812311 (1974-05-01), Kvaternik
patent: 4618821 (1986-10-01), Lenz
patent: 5720098 (1998-02-01), Kister
patent: 5742174 (1998-04-01), Kister et al.
patent: 5764072 (1998-06-01), Kister
patent: 5923178 (1999-07-01), Higgins et al.
patent: 6411112 (2002-06-01), Das et al.

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