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Test pattern for analyzing delay characteristic of...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test pattern for separately determining plug resistance and inte

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test pattern for testing contact resistance of a subject via...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test pattern for use in measuring thickness of insulating...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test pattern group and a method of measuring an insulation film

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test patterns for optical measurements on multiple binary...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test probe

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test probe and tester, method for manufacturing the test probe

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test probe and tester, method for manufacturing the test probe

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test probe for electrical devices having low or no wedge...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test probe for panel having an overlying protective member adjac

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test structure to measure interlayer dielectric effects and...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test structure, integrated circuit, and test method

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test system and test method for liquid crystal display device

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test system for measurements of insulation resistance

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Test system with reduced test contact interface resistance

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing and display of electrical system impedance

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing apparatus and connector for liquid crystal display subst

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing apparatus and method for thin film transistor...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing apparatus for flat-panel display

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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