Test probe for panel having an overlying protective member adjac

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

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Details

3241581, 439 67, 439 77, G01R 104

Patent

active

053789822

ABSTRACT:
A test probe for use in testing a liquid crystal display device includes a rigid carrier block (20) having a lower surface to which is secured a flexible circuit (44) having a free end (50) aligned with the free end (26) of the carrier block. A plurality of projecting probe contact features (54) are integrally formed on traces (56) of the flexible circuit (44) and project from the plane of the flexible circuit adjacent the free end. An elastomeric back-up pad (40) is interposed between the carrier block (20) and the projecting contact features (54). The lower side of the carrier block is recessed (30) and the flexible circuit is pre-formed to the configuration of the recess in which it is mechanically secured by a rigid clamp or pressure bar (60). Conductive traces (56) of the flexible circuit have inner ends (58) bearing electrical contacts (68) for connection to test circuitry. The rigid carrier block (20) is mounted to enable the projecting probe contact features to be pressed against a line of contacts (16) on a display device panel (12) while maintaining a clearance between the aligned free ends of the carrier block (26), elastomer (42) and flexible circuit (50) and the edge (70) of a member (18) that overlies the display panel (12) and extends closely adjacent to and parallel to the row of display panel contacts (16).

REFERENCES:
patent: 3832632 (1974-08-01), Ardezzone
patent: 4571542 (1986-02-01), Arai
patent: 4585727 (1986-04-01), Reams
patent: 4887030 (1990-12-01), Niki et al.
patent: 5055776 (1991-10-01), Miller et al.
patent: 5177438 (1991-08-01), Littlebury et al.

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