Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-09-10
1996-08-06
Nguyen, Vinh P.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324752, G01R 1900
Patent
active
055437290
ABSTRACT:
An elastic member is wrapped with wire or a wire mesh to provide uniform electrical contact with a substrate. The elastic member is compressible, allowing pressure to be applied, and a firmer contact established without damaging the contact points on the substrate.
REFERENCES:
patent: 3908153 (1975-09-01), Cason, Jr.
patent: 3992663 (1976-11-01), Seddick
patent: 3998513 (1976-12-01), Kobayashi et al.
patent: 4019094 (1977-04-01), Dinger et al.
patent: 4065717 (1977-12-01), Kattner et al.
patent: 4242635 (1980-12-01), Burns
patent: 4355278 (1982-10-01), Burns et al.
patent: 4368523 (1983-01-01), Kawate
patent: 4444801 (1984-04-01), Hongo et al.
patent: 4463073 (1984-07-01), Miyauchi et al.
patent: 4465969 (1984-08-01), Tada et al.
patent: 4507605 (1985-03-01), Geisel
patent: 4510222 (1985-04-01), Okunaka et al.
patent: 4523847 (1985-06-01), Bjorklund et al.
patent: 4542333 (1985-09-01), Koontz
patent: 4563093 (1986-01-01), Tada et al.
patent: 4618819 (1986-10-01), Mourou et al.
patent: 4631576 (1986-12-01), St. John
patent: 4633242 (1986-12-01), Sekiya
patent: 4636403 (1987-01-01), Fisanick et al.
patent: 4688900 (1987-08-01), Doane et al.
patent: 4727234 (1988-02-01), Oprysko et al.
patent: 4729166 (1988-03-01), Lee et al.
patent: 4758092 (1988-07-01), Heinrich et al.
patent: 4776022 (1988-10-01), Fox et al.
patent: 4819038 (1989-04-01), Alt
patent: 4825201 (1989-08-01), Watanabe et al.
patent: 4855591 (1989-08-01), Nakamura et al.
patent: 4862075 (1989-08-01), Choi et al.
patent: 4868492 (1989-11-01), Beha et al.
patent: 4875006 (1989-10-01), Henley et al.
patent: 4899105 (1990-02-01), Akiyama
patent: 4906922 (1990-03-01), Takahashi et al.
patent: 4910458 (1990-03-01), Forsyth et al.
patent: 4927368 (1990-05-01), Shino
patent: 4943768 (1990-07-01), Niki et al.
patent: 4944576 (1990-07-01), Lacker et al.
patent: 4983911 (1991-01-01), Henley
patent: 4999577 (1991-03-01), Beha et al.
patent: 5017755 (1991-05-01), Yahagi et al.
patent: 5037683 (1991-07-01), Takahashi et al.
patent: 5043297 (1991-08-01), Suzuki et al.
patent: 5113134 (1992-05-01), Plus et al.
patent: 5116241 (1992-05-01), Sato
System Tests Devices At GHz Rates, Lyle H. McCarty, Design News, Apr. 10, 1989.
Electro-Optic Device Tester Tops 1 GHz, John Novellino, Electronic Design, Sep. 8, 1988.
An Ultra High Speed Test System, Francois J. Henley, IEEE Design & Test of Computers, Feb. 1989.
** Electro-Optic Technology Supports Gigahertz Speeds; Francois J. Henley, Electronics Test, Sep. 1988.
** Using Electro-Optic Sampling Technology For Accurate Gigahertz ATE: Overview of the Art, Francois J. Henley, 1990 IEEE VLSI Test Symposium (no month available).
High Speed Pattern Generator and GaAs Pin Electronics for a Gigahertz Production Test System, D. J. Kratzer, S. Barton, F. J. Henley D. A. Plomgren, Proceedings of IEEE 1988 Int'l Test Conf, Sep. 1988.
Test Head Using Electro-Optic Receivers and GaAs Pin Eloectronics for a Gigahertz Production Test System, F. J. Henley, H. J. Choi, Proceedings of IEEE 1988 Int'l Test Conference, Sep. 1988.
Achieving ATE Accuracy at Gigahertz Test Rates: Comparison of Electronic and Electro-Optic Sampling Technologies, F. J. Henley, H. J. Choi, Int'l Test Conf. Aug., 1989.
Systems Solutions Based on Electro-Optic Sampling to High Speed IC Test Problems, F. J. Henley, D. B. MacDonald, SPIE vol. 795 Characterization of Very High Speed Semiconductor Devices & Integrated Circuits (1987) pp. 345-351 (no month available).
Characterization of High Seed (Above 500 MHz) Devices Using Advanced ATE-Techniques, Results and Device Problems, S. Barton, Proceedings of the IEEE 1989, Int'l Test Conf., Aug. 1989.
Measurement of Electro-Optic Characteristics of LCDs; M. E. Becker et al.; SID 90 Digest; pp. 163-166; 1990 (no month available).
Testing and Qualificastions of a Si TFT-LC Color Cells for Military Avionics Applications: F. C. Luo et al; SID 90 Digest; pp. 194-196; 1990 (no month available).
In-Process Testing of Thin Film Transistor Arrays; R. Wisnieff et al.; SID 90 Digest pp. 190-193 (no month available).
NCAP Displays: Optical Switching and Dielectric Properties; L. Welsh et al.; SID 90 Digest; pp. 220-223 (no month available).
Nguyen Vinh P.
Photon Dynamics, Inc.
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