Test system with reduced test contact interface resistance

Details Test system with reduced test contact interface resistance Test system with reduced test contact interface resistance

1992-02-28

1993-06-22

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324158R, 324538, G01R 2714, G01R 3104

Patent

active

052219054

ABSTRACT:
An improved test system includes means for generating a contact wetting pulse and applying the contact wetting pulse to a network such that contact resistance at the interfaces between probes of the test system and terminals of the network is effectively lowered.

REFERENCES:
patent: 3417323 (1968-12-01), Williamson
patent: 4477774 (1984-10-01), Revirieux
patent: 4491797 (1985-01-01), Velsher
patent: 4783631 (1988-11-01), Nakashima et al.
patent: 5019771 (1991-05-01), Yang et al.
IBM Technical Disclosure Bulletin, vol. 15, No. 11, Apr. 1973 "Insuring Proper Probe Contact During the Testing of Integrated Circuit Chips," by E. M. Hubacher.

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