Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-09-05
2006-09-05
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S678000
Reexamination Certificate
active
07102378
ABSTRACT:
A testing circuit and method for thin film transistor display array, for testing the yield of a thin film transistor array is provided. The testing circuit includes an array tester, a test panel (DUT) and a sense amplifier array. The sense amplifier is composed of a plurality of trans-impedance amplifier units and a plurality of parasitic capacitance discharge circuit units. Every sense amplifier includes a trans-impedance amplifier, which is implemented by an operational amplifier, two switches and an operation capacitance. The trans-impedance amplifier is used to form an integrated circuit and the output is transmitted to a sampling/hold circuit via a switch. Also included is a parasitic capacitance discharge circuit that is used to form a discharge route for the charge of the parasitic capacitance.
REFERENCES:
patent: 5561381 (1996-10-01), Jenkins et al.
patent: 6262589 (2001-07-01), Tamukai
Kuo Kuang I
Tien Hsiao Tung
Perkins Coie LLP
Primetech International Corporation
Tang Minh N.
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