Test probe for electrical devices having low or no wedge...

Details Test probe for electrical devices having low or no wedge... Test probe for electrical devices having low or no wedge...

2005-08-09

2005-08-09

Hollington, Jermele M. (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

06927598

ABSTRACT:
A probe for use in detecting abnormalities in an electrical device having a wedge depression of no more than 100 mils. The probe includes a solid core surrounded by a sense coil. The ends of the core are arranged in a contact-free, spaced relationship between and at least partially above opposed surfaces of adjacent lamination teeth of a stator. Air gaps are maintained between the ends of the probe core and the opposed surfaces. The total of the two air gaps is constant. The probe is supported on a carriage arrangement and moved along the teeth. Variations in leakage flux produced with the stator energized with an energization winding to produce a flux which is a few percent of a normal energization level, are monitored.

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