Test probe and tester, method for manufacturing the test probe

Details Test probe and tester, method for manufacturing the test probe Test probe and tester, method for manufacturing the test probe

2008-04-29

2008-04-29

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

07365561

ABSTRACT:
A test probe having a conductive part electrically connected to terminals of a test-object device, including: a silicon substrate; a protrusion made of resin provided on the silicon substrate; a first conductive part which is provided on the protrusion and comes in contact with the terminals; and a second conductive part which is provided in a region other than a region having the protrusion on the silicon substrate and is electrically connected to the first conductive part.

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