4. Data processing: measuring, calibrating, or testing
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Self-test circuit for high-definition multimedia interface...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-test with split, asymmetric controlled driver output stage

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-testable spacecraft for self-testing analog functions

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system
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Self-testing of smart line cards

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-tuning ultrasonic meter

Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing
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Semblance processing for an acoustic...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
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Semblance processing for an acoustic...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
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Semi-definite programming method for ad hoc network node...

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
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Semiconductor chip inspection supporting apparatus

Data processing: measuring – calibrating – or testing – Calibration or correction system
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Semiconductor device

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Semiconductor device and communications terminal and...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Semiconductor device and noise measuring method

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
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Semiconductor device and semiconductor device testing method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device and testing circuit which can carries...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device capable of test mode operation

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device fabrication method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device having a mode of functional test

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device having a test circuit for testing an...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device having a test circuit for testing an...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device having a test-voltage generation circuit

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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