Semiconductor device having a test-voltage generation circuit

Details Semiconductor device having a test-voltage generation circuit Semiconductor device having a test-voltage generation circuit

2007-06-11

2009-12-01

Lau, Tung S (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

07627442

ABSTRACT:
A semiconductor device includes an internal power supply line, a first power supply circuit, and second power supply circuits. The first power supply circuit includes an ordinary-voltage generation circuit supplying an ordinary voltage to the internal power supply line during an ordinary operation, and a test-voltage generation circuit supplying a test voltage to the internal power supply line during a test operation. Each of the second power supply circuits includes only an ordinary-voltage generation circuit. The number of ordinary-voltage generation circuits is thereby larger than the number of test-voltage generation circuits. Therefore, the ordinary voltage such as the precharge potential can be stably supplied to the internal power supply line while suppressing an increase in chip area.

REFERENCES:
patent: 2005/0088881 (2005-04-01), Miki et al.
patent: 06-236925 (1994-08-01), None
patent: 07-111455 (1995-04-01), None

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