4. Data processing: measuring, calibrating, or testing
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Wafer alignment system

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement
Reexamination Certificate

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Wafer alignment system

Data processing: measuring – calibrating – or testing – Testing system – For transfer function determination
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Wafer edge detector

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
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Wafer edge inspection data gathering

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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Wafer fabrication data acquisition and management systems

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Wafer fabrication system providing measurement data screening

Data processing: measuring – calibrating – or testing – Testing system – Including multiple test instruments
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Wafer inspection device

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Wafer inspection device

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Wafer inspection system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Wafer processing system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
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Wafer rotation in semiconductor processing

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
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Wafer rotation randomization for process defect detection in...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
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Wafer sidewall inspection system and method

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Wafer target design and method for determining centroid of...

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
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Wafer temperature measurement method for plasma environments

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
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Walking condition determining device and method

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
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Wander gamut display

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Warranty controlling software and device

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system
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Watches and notifications

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Water heater monitor/diagnostic display apparatus

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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