Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system
Reexamination Certificate
1999-01-22
2001-11-27
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of mechanical system
C706S048000
Reexamination Certificate
active
06324484
ABSTRACT:
TECHNICAL FIELD
The present invention relates to space and communications satellites, and more particularly, to testing the operability of electrical components within the satellite.
BACKGROUND ART
Satellites have complex systems with various analog and digital circuits and components that are interconnected through a complex wiring schematic. Commonly, the various systems within a satellite are tested prior to launch.
The functioning and interconnections between the systems are checked on a system operability level. The systems are not necessarily checked during assembly or incorporation into the satellites or their functions with other systems. Also, since satellites have back-up systems, the systems may default to their back-up modes of operation without alerting ground control of an error. The systems may operate for months or years without detection of the activation of the back-up mode.
It is desirable to test the operability of various circuits while the satellite is in orbit and determine their status and functionality. Further, it is desirable to test the operability of the circuits while the satellite is being assembled.
SUMMARY OF THE INVENTION
One object of the invention is to provide a self-testing feature into a spacecraft to provide information regarding the operability of various electrical components within the satellite. It is a further object of the invention to provide a means for providing self-testing after the launch of a satellite.
In one aspect of the invention, a satellite has a test module coupled to a plurality of electrical components. The test module sends test signals to the electrical components. In response to the test signals, the electrical components generate a response signal that is received by the test module. The test module provides an indication of the operability of the electrical components in response to the received response signals.
In a further aspect of the invention, the test module includes a multiplexer that is coupled to the plurality of circuit elements. An analog-to-digital converter is coupled to the multiplexer. A test signal generator is also located within the test module. A controller is coupled to the analog-to-digital converter and to the test signal generators, and generates test signals. The test signals are received by the multiplexer, which routes the test signals through the analog-to-digital converter and back to the controller. The controller provides an indication, through an indicator, as to the functionality of the circuit elements. The indicator may be an audio indicator or a visual indicator such as a LED display or a computer screen display.
One advantage of the invention is that the test module may be implemented onboard a satellite. Thus, during idle time in the operation of the satellite or when a portion or portions of the satellite are idle, the test module may test the functionality of various elements and their interconnection wiring. Another advantage is that many of the components exist in circuitry already on the satellite. Thus, implementation of the invention may be accomplished relatively inexpensively.
Other objects and features of the present invention will become apparent when viewed in light of the detailed description of the preferred embodiment when taken in conjunction with the attached drawings and appended claims.
REFERENCES:
patent: 4977579 (1990-12-01), Bateman
patent: 5047700 (1991-09-01), Szakaly
patent: 6157812 (2000-12-01), Sarraf
Gudmestad Terje
Hoff Marc S.
Hughes Electronics Corporation
Raymond Edward
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