Semiconductor device

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Reexamination Certificate

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08073643

ABSTRACT:
A semiconductor device which includes a power switch connecting an internal power supply in which power is not shut down and an internal power supply in which power is shut down, and an internal voltage determining circuit for determining the voltage of the internal power supply in which power is shut down. When the power of the internal power supply is interrupted, the power switch is turned off, the regulator circuit is turned off, and an output of the regulator circuit is shorted to a ground potential. When the power of the internal power supply is resumed, the regulator circuit is turned on, shorting is cancelled, the increased voltage of the internal power supply is determined by the internal voltage determining circuit, operation of a circuit block is started, and the switch is turned on.

REFERENCES:
patent: 4333049 (1982-06-01), Yui et al.
patent: 6092207 (2000-07-01), Kolinski et al.
patent: 6857093 (2005-02-01), Ooishi
patent: 2003/0043680 (2003-03-01), Akiba et al.
patent: 2003/0223289 (2003-12-01), Ganivet et al.
patent: 2005/0185450 (2005-08-01), Isoda et al.
patent: 2007/0145922 (2007-06-01), Ito et al.
patent: 2007/0273345 (2007-11-01), Chen et al.
patent: 2003-32399 (2003-01-01), None

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