Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2008-07-24
2011-11-15
Charioui, Mohamed (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
Reexamination Certificate
active
08060343
ABSTRACT:
Provided is a semiconductor device for outputting only the necessary information from non-periodic noise information to the outside. An analysis object information extracting section specifies analysis object information used to analyze noise associated with a malfunction from the non-periodic noise information having a large amount of information and extracts only the specified analysis object information from the noise information. A communication section outputs the extracted analysis object information to the outside. Thus, the amount of the information can be reduced and the noise information can be outputted by an inexpensive communication section such as a serial communication device.
REFERENCES:
patent: 6292517 (2001-09-01), Jeffress et al.
patent: 6449570 (2002-09-01), Wilstrup et al.
patent: 2004/0146098 (2004-07-01), Eliezer et al.
patent: 2005/0165573 (2005-07-01), Takamiya et al.
patent: 5-334457 (1993-12-01), None
patent: 06-130093 (1994-05-01), None
patent: 2004-233235 (2004-08-01), None
patent: 2005-098981 (2005-04-01), None
M. Takamiya et al., “A Sampling Oscilloscope Macro Toward Feedback Physical Design Methodology”, VLSI Circuits, 2004, Digest of Technical Papers, 2004 Symposium, pp. 240-243.
T. Nakura et al., “Power Supply di/dt Measurement Using On-chip di/dt Detector Circuit”, Digest of Technical Papers. 2004 Symposium on VLSI Circuits, pp. 106-109.
T. Okumoto et al., “A Built-in Technique for Probing Power-Supply Noise Distribution Within Large-Scale Digital Integrated Circuits”, Digest of Technical Papers. 2004 Symposium on VLSI Circuits, pp. 98-101.
K. Shimazaki et al., “Dynamic Power-Supply and Well Noise Measurement and Analysis for High Frequency Body-Biased Circuits”, Digest of Technical Papers. 2004 Symposium on VLSI Circuits, pp. 94-97.
E. Alon et al., “Circuits and Techniques for High-Resolution Measurement of On-Chip Power Supply Noise”, Digest of Technical Papers. 2004 Symposium on VLSI Circuits, pp. 102-105.
Japanese Office Action mailed Jul. 5, 2011 for corresponding Japanese Application No. 2007-556741, with partial English-language translation.
Charioui Mohamed
Fujitsu Limited
Fujitsu Patent Center
LandOfFree
Semiconductor device and noise measuring method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and noise measuring method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and noise measuring method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4298246