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Indirect techniques for measuring 1/f noise

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Information handling system including power supply self...

Data processing: measuring – calibrating – or testing – Testing system
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Input-output circuit and a testing apparatus

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Inspection equipment integrity enhancement system

Data processing: measuring – calibrating – or testing – Testing system
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Instruction register and access port gated clock for scan cells

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Instrument architecture with circular processing queue

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Instrument ring architecture for use with a multi-core...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Instrument with interface for synchronization in automatic...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Instrument with interface for synchronization in automatic...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Instrumentation system and method including an improved...

Data processing: measuring – calibrating – or testing – Testing system – Including multiple test instruments
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Integrated adjustable short-haul/long-haul time domain...

Data processing: measuring – calibrating – or testing – Testing system – For transfer function determination
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Integrated circuit and method for determining the operating...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Integrated circuit and the corresponding test method,...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Integrated circuit characterisation system and method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Integrated circuit device having a test circuit to measure...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Integrated circuit tester including at least one quasi-autonomou

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent

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Integrated circuit tester information processing system for...

Data processing: measuring – calibrating – or testing – Testing system – For transfer function determination
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Integrated circuit tester with real time branching

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Integrated circuit testing method, program, storing medium,...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Integrated circuit with bit error test capability

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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