Integrated adjustable short-haul/long-haul time domain...

Details Integrated adjustable short-haul/long-haul time domain... Integrated adjustable short-haul/long-haul time domain...

2005-03-01

2005-03-01

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

For transfer function determination

C324S533000

Reexamination Certificate

active

06862546

ABSTRACT:
A method and system for performing integrated adjustable short-haul/long-haul time domain reflectometry (TDR). A TDR pulse count is set to a predetermined number. Next, a TDR pulse is transmitted through a cable. The width of the TDR pulse is a function of the multiplication of the TDR pulse count with the period of a TDR clock. It is then determined whether the TDR pulse has been reflected back. If the TDR pulse has not been reflected, the TDR pulse count is successively increased to successively increase the width of the transmitted TDR pulse until a reflection is detected—indicating an open in the cable. Furthermore, it eliminates false detections of cable opens. Moreover, the system can be combined into a line interface unit (LIU) integrated circuit such that TDR functionality can be performed automatically without the use of a technician.

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“LXT360/361 Integrated T1/E1 LH/SH Transceivers for DS1/DSX-1/CSU or NTU/ISDN PRI Application”, Level One, Mar. 1997.*
Intel Product Brief; Intel LXT3108, Octal 3.3V Long-haul/Short-haul T1/E1/J1 Line Interface Unit; Order No. 249083-001; 2001.
Inter White Paper; Intelligent T1/E1/J1 Solutions for Voice Over Packet (VoP) Gateways; Order No. 249740-001; 2001.

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