LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing,Testing system,Of circuit

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Method and system for testing a memory of a microprocessor

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method and system for testing assembled mobile devices

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method and system for testing assembled mobile devices

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method and system for testing integrated circuits

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Method and system for testing rambus memory modules

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Method and system for testing RAMBUS memory modules

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Method and system for testing spas

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method and system for the interactive testing of assembled...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Method and system for the interactive testing of assembled...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method and system for timing measurement of embedded macro...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method and system for verifying an embedded module of a...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method and system for wafer and device-level testing of an...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method and system for wideband device measurement and modeling

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Method and system of generic implementation of sharing test...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method and system to self-test single and multi-core CPU...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method evaluating threshold level of a data cell in a memory...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method for activating the functions of an electrical apparatus

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method for analyzing data storage system test data

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Method for automatic testing PCMCIA cards

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Method for connecting test bench elements and shell device

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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