Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-02-21
2006-02-21
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
Reexamination Certificate
active
07003422
ABSTRACT:
The invention provides a method for connecting test bench elements (102a–102f), and a shell device, a test bench element shell (201) partially or completely surrounding a circuit unit (101) to be verified, so that test bench elements (102a–102f) can be connected to the test bench element shell (201). Test data streams (203a–203f) pass in each case between the test bench elements (102a–102f) and the test bench element shell (201), the test bench element shell (201) which surrounds the circuit unit (101) to be verified being connected via interface data streams (P0(0)–P0(7), P1(0)–P1(7),204a,204b,204c) to the circuit unit (101) to be verified. The test bench element shell (201) ensures that in each case a specific protocol with associated operations can be executed, during which process, depending on the configuration, an interface exchanges interface data streams (P0(0)–P0(7), P1(0)–P1(7),204a–204c) of the circuit unit (101) to be verified with the corresponding test bench element (102a–102f).
REFERENCES:
patent: 5923867 (1999-07-01), Hand
patent: 2003/0028343 (2003-02-01), Velichko et al.
patent: WO 01/37089 (2001-05-01), None
Bauer Matthias
Ecker Wolfgang
Henftling Renate
Zambaldi Martin
Zinn Andreas
Bhat Aditya S.
Bui Bryan
Infineon - Technologies AG
Jenkins & Wilson & Taylor, P.A.
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