Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-02-20
2007-02-20
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S123000, C714S724000, C714S725000, C714S741000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
10988081
ABSTRACT:
The present invention provides a method and a system of generic implementation of sharing test pins with I/O cells. The method includes a step of making a general change in a testlib file. The testlib file is suitable for controlling I/O cell pins to gain test access. The general change restricts I/O cells for sharing with test pins. The method further includes a step of making iogen changes for sharing. Optionally, the method may include a step of making a cell level change in the testlib file. The cell level change overrides restrictions defined by the general change.
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Suiter-Swantz PC LLO
Tsai Carol S. W.
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