Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-09-29
2008-12-09
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
Reexamination Certificate
active
07463992
ABSTRACT:
A method, apparatus, article of manufacture, and system, the method including, in some embodiments, performing an in-system (or in-the-field) self-test on a first core of a multi-core (or multi-CPU) processor to obtain at a value for at least one operational parameter of the first core, storing the value for the at least one operational parameter of the first core, testing, under control of the first core, at least one of a remaining set of cores of the multi-core processor to determine a value for the at least one operational parameter for the at least one core of the remaining set of cores, and testing, under control of the at least one core of the remaining set of cores, the first core to determine a value for the at least one operational parameter for the first core.
REFERENCES:
Alon Naveh, Intel Technology Journal, Intel Centrino Duo Mobile Technology, vol. 10, Issue 02, p. 109-122, Published May 15, 2006.
http://www.merriam-webster.com/dictionary/boundary, p. 1.
Samaan Samie B.
Tripp Michael
Zia Victor
Buckley Maschoff & Talwalkar LLC
Intel Corporation
Lau Tung S
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