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Test structure of semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test structure responsive to electrical signals for determining

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Test structure responsive to electrical signals for determining

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Test structure to determine the effect of LDD length upon transi

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Test structure to monitor the effects of polysilicon pre-doping

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test structure used to measure metal bottom coverage in...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structure with TDDB test pattern

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures and methods for inspection of semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures and models for estimating the yield impact...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures and models for estimating the yield impact...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures for development of metal-insulator-metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures for development of metal-insulator-metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures for electrically detecting back end of the...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test structures for identifying open contacts and methods of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures for monitoring gate oxide defect densities and t

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Test structures for monitoring gate oxide defect densities...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test structures for stacking dies having through-silicon vias

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test structures for substrate etching

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test tray with carrier modules for a semiconductor device...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test vehicle grid array package

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate

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