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Test structures for monitoring gate oxide defect densities and t

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Test structures for monitoring gate oxide defect densities...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test structures for stacking dies having through-silicon vias

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test structures for substrate etching

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test tray with carrier modules for a semiconductor device...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test vehicle grid array package

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate

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Test vehicle with zig-zag structures

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test wafer and method for producing the test wafer

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Testable electrostatic discharge protection circuits

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Testable electrostatic discharge protection circuits

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Testable low inductance integrated circuit package

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With contact or lead
Patent

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Testable substrate and a testing method

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Testchip design for process analysis in sub-micron DRAM fabricat

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Testing for correct undercutting of an electrode during an...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Testkey design pattern for gate oxide

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Textured Bi-based oxide ceramic films

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Textured light emitting diodes

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – Plural light emitting devices
Reexamination Certificate

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Textured metallic compression bonding

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – With textured surface
Patent

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Texturized polycrystalline silicon to aid field oxide formation

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Including dielectric isolation means
Patent

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TFCC (TM) and SWCC (TM) thermal flex contact carriers

Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame
Reexamination Certificate

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