LandOfFree - US Patents - Listing for Active solid-state devices (e.g., transistors, solid-state diode

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Test structure for insulation-film evaluation

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structure for locating electromigration voids in dual...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structure for measuring effective channel length of a...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structure of a semiconductor device and semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Test structure of DRAM

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Test structure of semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structure of semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structure responsive to electrical signals for determining

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Patent

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Test structure responsive to electrical signals for determining

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Patent

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Test structure to determine the effect of LDD length upon transi

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Patent

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Test structure to monitor the effects of polysilicon pre-doping

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structure used to measure metal bottom coverage in...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structure with TDDB test pattern

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures and methods for inspection of semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures and models for estimating the yield impact...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures and models for estimating the yield impact...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for development of metal-insulator-metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for development of metal-insulator-metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for electrically detecting back end of the...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

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Test structures for identifying open contacts and methods of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

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