4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure
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System and method for measuring residual stress

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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System for characterization of low-k dielectric material damage

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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System for split package power and rotational burn-in of a...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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System for testing semiconductor chip leads constrained in...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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System LSI chip having a logic part and a memory part

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Systems and methods for estimating thermal resistance of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Systems and methods for overlay shift determination

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Systems and methods for testing germanium devices

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Systems and methods for testing germanium devices

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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