LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application

X-ray or gamma ray systems or devices – Specific application – Lithography

Mask holding device, and an exposure apparatus and a device manu

X-ray or gamma ray systems or devices – Specific application – Lithography

Mask holding method, mask and mask chuck, exposure apparatus usi

X-ray or gamma ray systems or devices – Specific application – Lithography

Mask pattern magnification correction method, magnification...

X-ray or gamma ray systems or devices – Specific application – Lithography

Mask ring assembly for X-ray lithography

X-ray or gamma ray systems or devices – Specific application – Lithography

Mask structure and mask holding mechanism for exposure apparatus

X-ray or gamma ray systems or devices – Specific application – Lithography

Mask structure for x-ray exposure and x-ray exposure device and

X-ray or gamma ray systems or devices – Specific application – Lithography

Mask supporting device and correction method therefor, and expos

X-ray or gamma ray systems or devices – Specific application – Lithography

Mask used for LIGA process, method of manufacturing the...

X-ray or gamma ray systems or devices – Specific application – Mammography

Mass detection by computer using digital mammograms of the same

X-ray or gamma ray systems or devices – Specific application – Mammography

Mass detection in digital radiologic images using a two stage cl

X-ray or gamma ray systems or devices – Specific application – Lithography

Mass limited target

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Matched view weighting methods and apparatus using multiple...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Material analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Material analysis using multiple X-ray reflectometry models

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Material composition analyzer and method

X-ray or gamma ray systems or devices – Specific application – Absorption

Material handling and inspection apparatus and method

X-ray or gamma ray systems or devices – Specific application – Absorption

Material identification using x-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Means and method for determining residual stress on a polycrysta

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Measurement apparatus and method for determining the...