Measurement apparatus and method for determining the...

Details Measurement apparatus and method for determining the... Measurement apparatus and method for determining the...

2007-06-19

2007-06-19

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Fluorescence

C378S045000

Reexamination Certificate

active

11134740

ABSTRACT:
A measurement apparatus and method are provided for determining the material composition of a sample. An X-ray fluorescence detector (412) detects fluorescent X-rays coming from said sample under irradiation with incident X-rays. A laser source (301) is adapted to produce a laser beam. Focusing optics (302) focus said laser beam into a focal spot on a surface of said sample. An optical sensor (312) detects optical emissions coming from particles of said sample upon being exposed to said laser beam at said focal spot. A gas administration subsystem (104, 105, 106, 107, 108) is adapted to controllably deliver gas to a space (101) around said focal spot.

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R. Dabu et al. “Design and characterization of an end-pumped Nd:YAG microlaser,”Romanian Report in Physics, vol. 56, No. 2 pp. 294-305 (2004)—National Institute for Lasers, Plasma, and Radiation Physics, Bucharest, Romania.

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