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Apparatus and method for examining a body, particularly useful i

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Apparatus and method for fluid phase fraction determination...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Apparatus and method for fluorescent x-ray analysis of light and

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent

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Apparatus and method for focusing hard X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Apparatus and method for generating a high intensity X-ray...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Apparatus and method for generating monochromatic X-ray...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Apparatus and method for identifying specific bone regions in di

X-ray or gamma ray systems or devices – Specific application – Absorption
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Apparatus and method for image processing

X-ray or gamma ray systems or devices – Specific application – Absorption
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Apparatus and method for imaging an object with real-time...

X-ray or gamma ray systems or devices – Specific application – Absorption
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Apparatus and method for imaging objects with wavefields

X-ray or gamma ray systems or devices – Specific application – Absorption
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Apparatus and method for imaging with wavefields using inverse s

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Apparatus and method for imaging with wavefields using inverse s

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Apparatus and method for improved energy dispersive X-ray...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Apparatus and method for improved tissue imaging

X-ray or gamma ray systems or devices – Specific application – Mammography
Patent

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Apparatus and method for in-situ measurement of residual...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Apparatus and method for inspecting a crystal

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Apparatus and method for measuring the orientation of a single c

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Apparatus and method for measuring the roughness of a target mat

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Apparatus and method for measuring thickness

X-ray or gamma ray systems or devices – Specific application – Absorption
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Apparatus and method for measuring thickness and composition...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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