Apparatus and method for measuring thickness

Details Apparatus and method for measuring thickness Apparatus and method for measuring thickness

1981-09-18

1986-03-04

Smith, Alfred E.

X-ray or gamma ray systems or devices

Specific application

Absorption

2503581, 364563, G01N 2316, G01B 1502

Patent

active

045743878

ABSTRACT:
This invention applies to thickness gauges consisting of a radiation source producing a beam aimed at a detector. Whenever a material to be gauged obstructs the radiation beam, the intensity received by the detector (detector output) varies and said variation can be translated into a thickness measurement. Standards are used for calibration. This invention provides computer means and methods that provide better measurements by using a function relating the thickness to the detector output in a large range and independently of random inaccuracies of the standards.

REFERENCES:
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patent: 3742217 (1973-06-01), Eakman et al.
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patent: 3936665 (1976-02-01), Donoghue
patent: 4009376 (1977-02-01), Faraguet
patent: 4119846 (1978-10-01), Outhwaite et al.
patent: 4155009 (1979-05-01), Lieber et al.
patent: 4309606 (1982-01-01), Bjorkman et al.
patent: 4510577 (1985-04-01), Tsujii et al.

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