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Bi-directional differential low power sense amp and memory...

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Bi-directional differential low power sense amp and memory...

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Bi-directional sense amplifier stage for memory datapath

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Bi-mode sense amplifier with dual utilization of the...

Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate

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Bi-MOS semiconductor memory having high soft error immunity

Static information storage and retrieval – Read/write circuit – Including signal comparison
Patent

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Bias and precharging circuit for use in reading EPROM cells

Static information storage and retrieval – Read/write circuit – Precharge
Patent

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Bias circuit for read amplifier circuits for memories

Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing
Reexamination Certificate

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Bias distribution network for digital multilevel nonvolatile...

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Bias generator circuit for low voltage applications

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Patent

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Bias generator for a four transistor load less memory cell

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Bias generator for a four transistor load less memory cell

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Bias level generating circuit in a flash memory device

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Bias scheme to reduce burn-in test time for semiconductor memory

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Bias sensing in DRAM sense amplifiers

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Bias sensing in DRAM sense amplifiers through coupling and...

Static information storage and retrieval – Read/write circuit – Accelerating charge or discharge
Reexamination Certificate

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Bias sensing in DRAM sense amplifiers through...

Static information storage and retrieval – Read/write circuit – Accelerating charge or discharge
Reexamination Certificate

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Bias voltage applying circuit and semiconductor memory device

Static information storage and retrieval – Read/write circuit – Including level shift or pull-up circuit
Reexamination Certificate

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Bias voltage generator and method generating bias voltage...

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Biasing circuit and method to achieve compaction and self-limiti

Static information storage and retrieval – Read/write circuit – Erase
Patent

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Biasing circuit for use in a non-volatile memory device

Static information storage and retrieval – Read/write circuit – Including level shift or pull-up circuit
Reexamination Certificate

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