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Flexible and area efficient column redundancy for...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Flexible fuse placement in redundant semiconductor memory

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Flexible redundancy architecture and fuse download scheme

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Flexible redundancy for memories

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Floating bitline test mode with digitally controllable bitline e

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Folded bit line memory with one decoder per pair of spare rows

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Folded bit line memory with one decoder per pair of spare rows

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Fuse circuit and semiconductor memory device including the same

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Fuse repair circuit for semiconductor memory circuit

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Fuse selection of predecoder output

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Fuseless memory repair system and method of operation

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Fuses for memory repair

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Fusleless memory repair system and method of operation

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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