Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2008-09-09
2010-11-23
Dinh, Son (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S225700
Reexamination Certificate
active
07839707
ABSTRACT:
Structures for fuses to control repair of multiple memories embedded on an integrated circuit are provided along with methods of use. A set of fuses is shared to control repair of a plurality of memories. Some of the fuses are associated with a memory to be repaired. Others of the fuses identify how the repair is accomplished.
REFERENCES:
patent: 3753244 (1973-08-01), Sumilas et al.
patent: 4389715 (1983-06-01), Eaton, Jr. et al.
patent: 6426903 (2002-07-01), Clevenger et al.
patent: 6542418 (2003-04-01), Braceras et al.
patent: 6651202 (2003-11-01), Phan
patent: 6856569 (2005-02-01), Nelson et al.
patent: 7003622 (2006-02-01), Shinohara et al.
patent: 7174486 (2007-02-01), Adams et al.
patent: 7251756 (2007-07-01), Anand et al.
patent: 7308598 (2007-12-01), Beattie et al.
patent: 7627792 (2009-12-01), Di Ronza et al.
patent: 2002/0101777 (2002-08-01), Anand et al.
patent: 2006/0294440 (2006-12-01), Riley
Dinh Son
Klein O'Neill & Singh, LLP
Nguyen Nam
Vitesse Semiconductor Corporation
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