Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2007-01-03
2008-07-29
Luu, Pho M. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S185050, C365S185090, C365S185170
Reexamination Certificate
active
07405985
ABSTRACT:
A non-volatile memory wherein bad columns in the array of memory cells can be removed is described. Additionally, substitute redundant columns can replace the removed columns. Both of these processes are performed on the memory in a manner that is externally transparent and, consequently, need not be managed externally by the host or controller to which the memory is attached. An inventory of the bad columns can be maintained on the memory. At power up, the list of bad columns is used to fuse out the bad columns. The memory may also contain a number of redundant columns that can be used to replace the bad columns.
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Cernea Raul-Adrian
Li Yan
Davis , Wright, Tremaine, LLP
Luu Pho M.
SanDisk Corporation
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