Detecting method of impurity concentration in crystal, method fo
Determination of critical film thickness of a compound semicondu
Determination of critical film thickness of a compound semicondu
Device and a method for epitaxially growing objects by cvd
Device and a process for monitoring a melt for the...
Device and installation for crystal growth having observation me
Device and method for liquefying and crystallizing substances
Device and method for liquefying and crystallizing substances
Device and method for measuring position of liquid surface...
Device and method for producing at least one SiC single crystal
Device and method for producing single crystal
Device and method for producing single-crystal ingot
Device and method for pulling a single crystal
Device and method for the production of monocrystalline or...
Device and process for the crystallizing of non-ferrous metals
Device for controlling crystal growth processes
Device for detecting precipitate formation in microvolumes
Device for epitaxially growing objects
Device for growing crystals
Device for handling heavy components of a crystal puller accordi