Search
Selected: All

Stepped gap achromatic bending magnet

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Stereoscopic X-ray device

Radiant energy – With charged particle beam deflection or focussing – With target means
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Stigmator assembly

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Storage cell type X-ray apparatus

Radiant energy – With charged particle beam deflection or focussing – With target means
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Strong focus space charge

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Support means for a particle beam position monitor

Radiant energy – With charged particle beam deflection or focussing – With detector
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Switching device for an X-ray generator comprising a time switch

Radiant energy – With charged particle beam deflection or focussing – With target means
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Symmetric blanking for high stability in electron beam...

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Symmetric magnetic doublet for charged particle beam lithography

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Synthetic aperture scanner for decoding a coded image produced b

Radiant energy – With charged particle beam deflection or focussing – With target means
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System and method for a charged particle beam

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System and method for deflecting and focusing a broad ion beam

Radiant energy – With charged particle beam deflection or focussing – With target means
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System and method for fast focal length alterations

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System and method for nano-pantography

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System and method for producing superimposed static and time-var

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System and method for unipolar magnetic scanning of heavy ion be

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System and method of beam energy identification for single...

Radiant energy – With charged particle beam deflection or focussing – With detector
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System for controlling operation of the rotating anode of an X-r

Radiant energy – With charged particle beam deflection or focussing – With target means
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System for deflecting a beam of charged particles

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

System for taking wide-field beam-eye-view (BEV)...

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.