System and method of beam energy identification for single...

Details System and method of beam energy identification for single... System and method of beam energy identification for single...

2011-07-05

2011-07-05

Kim, Robert (Department: 2881)

Radiant energy

With charged particle beam deflection or focussing

With detector

C250S3960ML, C250S492100, C250S492300

Reexamination Certificate

active

07973290

ABSTRACT:
The present invention involves a beam energy identification system, comprising an accelerated ion beam, wherein the accelerated ion beam is scanned in a fast scan axis within a beam scanner, wherein the beam scanner is utilized to deflect the accelerated ion beam into narrow faraday cups downstream of the scanner, wherein a difference in scanner voltage or current to position the beam into the Faraday cups is utilized to calculated the energy of ion beam.

REFERENCES:
patent: 4667111 (1987-05-01), Glavish et al.
patent: 4922106 (1990-05-01), Berrian et al.
patent: 5091655 (1992-02-01), Dykstra et al.
patent: 5716742 (1998-02-01), Doran
patent: 6423976 (2002-07-01), Glavish et al.
patent: 6437350 (2002-08-01), Olson et al.
patent: 6831288 (2004-12-01), Schmitt et al.
patent: 7078713 (2006-07-01), White
patent: 2006/0169922 (2006-08-01), Chang et al.
patent: 2008/0283778 (2008-11-01), Tomimatsu et al.
patent: 2009/0146082 (2009-06-01), Stengl et al.

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