Ultrafast scanning probe microscopy

Ultrafine silicon tips for AFM/STM profilometry

Ultraviolet laser-generating device and defect inspection...

Undercut measurement using SEM

Universal, microfabricated probe for scanning probe microscopes

Unsupported, electron transparent films and related methods

Unsupported, electron transparent films and related methods

Use of carbon nanotubes as chemical sensors by incorporation...

Use of focused ion and electron beams for fabricating a sensor o

Use of multiple tips on AFM to deconvolve tip effects

Use of scanning probe microscope for defect detection and...

Using a crystallographic etched silicon sample to measure...

Vacuum bearing structure and a method of supporting a...

Vacuum chamber with recessed viewing tube and imaging device...

Vacuum processing apparatus and vacuum processing method

Vacuum sealed specimen holder support with motion damping means

Vacuum system comprising an evacuatable housing, an object holde

Valve device for a particle beam apparatus

Variable collimator

Variable temperature scanning probe microscope based on a peltie