Radiant energy – Inspection of solids or liquids by charged particles – Methods
Patent
1993-10-29
1995-05-16
Anderson, Bruce C.
Radiant energy
Inspection of solids or liquids by charged particles
Methods
250306, H01J 3700
Patent
active
054163277
ABSTRACT:
An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.
REFERENCES:
patent: 4921346 (1990-05-01), Tokumoto et al.
patent: 5060248 (1991-10-01), Dumoulin
patent: 5144833 (1992-09-01), Amer et al.
patent: 5196701 (1993-03-01), Foster et al.
patent: 5262642 (1993-11-01), Wessels et al.
patent: 5294804 (1994-03-01), Kajimura
"Ultrafast Scanning Probe Microscopy" by S. Weiss, D. Botkin, D. F. Ogletree, M. Salmeron and D. S. Chemla. Paper presented at the optical Microwave Interaction Conference held in Santa Barbara, Calif. in Jul. 1993.
"Ultrafast Scanning Microscopy" authored by S. Weiss, D. Botkin and D. S. Chemla. Presented at Optical Society of American Conference held in San Francisco, Calif. in Jan. 1993.
"Ultrafast Scanning Probe Microscopy" paper submitted to Applied Physics Letters accepted for publication, not yet published, authored by S. Weiss, D. F. Ogletree, D. Botkin, M. Salmeron and D. S. Chemla.
"Towards Ultrafast Movies of Moving Atoms" paper submitted to Optics and Photonics News, accepted for publication, not yet published, authored by S. Weiss, D. Botkin, D. F. Ogletree, M. Salmeron and D. S. Chemla.
Botkin David
Chemla Daniel S.
Ogletree D. Frank
Weiss Shimon
Anderson Bruce C.
Martin Paul R.
Moss Kathleen S.
Regents of the University of California
Ross Pepi
LandOfFree
Ultrafast scanning probe microscopy does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Ultrafast scanning probe microscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ultrafast scanning probe microscopy will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-639697