Process for electron beam guiding with energy selection and elec

Process for filtering electrically charged particles and energy

Process for monitoring ion-assisted processing procedures on waf

Projecting type charged particle microscope and projecting...

Reduced diameter retractable cylindrical mirror analyzer

Retarding field spectrometer

Sample holder apparatus to reduce energy of electrons in an...

Scanning and high resolution electron spectroscopy and imaging

Scanning and high resolution x-ray photoelectron spectroscopy an

Scanning auger microprobe with variable axial aperture

Scanning transmission electron microscope and electron...

Scattering target-holding mechanism and an electron spin...

Scintillator aspects for X-ray fluorescence visualizer,...

Secondary-electron detector for analyzing irradiated samples for

Selectable-resolution charged-particle beam analyzers

Slit disk for modified faraday cup diagnostic for...

Spatial-focus energy analyzer

Spectrometer and method of spectroscopy

Spectrometer objective for electron beam mensuration techniques

Spherical retarding grid analyzer