Secondary-electron detector for analyzing irradiated samples for

Details Secondary-electron detector for analyzing irradiated samples for Secondary-electron detector for analyzing irradiated samples for

1981-08-20

1983-09-20

Anderson, Bruce C.

Radiant energy

Electron energy analysis

250310, 250397, H01J 4000

Patent

active

044058616

ABSTRACT:
A secondary-electron detector for the analysis of irradiated samples in scanning electron microscopes and microprobes, including an electron collector 12 arranged along a curved or angular path, an electron accelerator 13, a scintillator 24, a light guide 27 and a photomultiplier 28. To enable more effective investigation of irradiated nuclear fuels and to improve the magnification power, a spectrometer 20 and a Wehnelt cylinder 25 are provided between the accelerator and the scintillator.

REFERENCES:
patent: 3585384 (1971-06-01), Castaing et al.
patent: 3937957 (1976-02-01), Schillalies et al.
patent: 4358680 (1982-11-01), Read

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