Sample holder apparatus to reduce energy of electrons in an...

Radiant energy – Electron energy analysis

Reexamination Certificate

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C250S310000, C250S3960ML, C250S505100, C250S440110, C073S864910

Reexamination Certificate

active

08071942

ABSTRACT:
A sample holder apparatus and method for reducing the energy of charged particles entering an annular-acceptance analyzer includes use of an electrically isolated sample support member having a sample receiving surface configured to receive a sample and electrically connect the sample to the sample support member (e.g., wherein the sample support member is configured for application of a retarding bias potential). A grounded sample aperture member defining an aperture relative to the sample support member but electrically isolated therefrom is provided such that the aperture is proximate the sample receiving surface to expose at least a portion of a surface of a sample received thereon to be analyzed (e.g., wherein applying a retarding bias potential to the sample support member produces an electrical retarding field about the aperture that reduces the energy of emitted particles from a sample before they enter an annular-acceptance analyzer).

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Watson et al., “High energy resolution Auger spectroscopy on a CMA instrument,”Surf. Interface Anal., 2011; 5 pgs. Published online Jun. 13, 2011.

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