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Apparatus and method for inspecting a patterned part of a...

Optics: measuring and testing – By light interference – Having polarization
Reexamination Certificate

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Apparatus and method for inspecting a semiconductor component

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Apparatus and method for inspecting a stream of matter by...

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Apparatus and method for inspecting a test lens, method of makin

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function
Patent

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Apparatus and method for inspecting circuit structures

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus and method for inspecting coating layer

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

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Apparatus and method for inspecting defect of mounted component

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Apparatus and method for inspecting defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus and method for inspecting defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Apparatus and method for inspecting defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus and method for inspecting defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus and method for inspecting elliplicity and eccentricity

Optics: measuring and testing – For optical fiber or waveguide inspection
Patent

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Apparatus and method for inspecting end faces of optical fibers

Optics: measuring and testing – For optical fiber or waveguide inspection
Patent

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Apparatus and method for inspecting film defect

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Apparatus and method for inspecting film defect

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus and method for inspecting fluorescent screen

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Apparatus and method for inspecting glass

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Apparatus and method for inspecting glass containers

Optics: measuring and testing – Refraction testing – Prism engaging specimen
Patent

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Apparatus and method for inspecting IC leads

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Apparatus and method for inspecting light transmittable...

Optics: measuring and testing – By monitoring of webs or thread – For flaws or imperfections
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